发明授权
US07002359B2 Apparatus and method for measuring EMI level of electronic device
失效
用于测量电子设备EMI电平的装置和方法
- 专利标题: Apparatus and method for measuring EMI level of electronic device
- 专利标题(中): 用于测量电子设备EMI电平的装置和方法
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申请号: US10830129申请日: 2004-04-21
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公开(公告)号: US07002359B2公开(公告)日: 2006-02-21
- 发明人: Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
- 申请人: Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
- 申请人地址: KR
- 专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人地址: KR
- 代理机构: Blakely Sokoloff Taylor & Zafman
- 优先权: KR10-2003-0093207 20031218
- 主分类号: G01R27/28
- IPC分类号: G01R27/28
摘要:
An apparatus and a method for measuring an electric magnetic interference (EMI) level of a radio frequency device is disclosed. The apparatus for measuring a level of electric magnetic interference (EMI) with an electronic device to radiate an electromagnetic wave, the apparatus including: a test device for outputting a signal in response to the electromagnetic wave radiated from the electric device; a calculating unit for calculating a group_delay variation information of the test device by using the signal from the test device; a processor for storing a reference group_delay variation; and an analyzer for analyzing the level of EMI by comparing the reference group_delay variation information and the group_delay variation information.
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