发明授权
US07005360B2 Method for fabricating a microelectronic circuit including applying metal over and thickening the integrated coil to increase conductivity 有权
一种制造微电子电路的方法,包括将金属涂覆在一起并增厚集成线圈以增加导电性

  • 专利标题: Method for fabricating a microelectronic circuit including applying metal over and thickening the integrated coil to increase conductivity
  • 专利标题(中): 一种制造微电子电路的方法,包括将金属涂覆在一起并增厚集成线圈以增加导电性
  • 申请号: US10381406
    申请日: 2001-10-04
  • 公开(公告)号: US07005360B2
    公开(公告)日: 2006-02-28
  • 发明人: Christl LauterbachChristian Paulus
  • 申请人: Christl LauterbachChristian Paulus
  • 申请人地址: DE
  • 专利权人: Infineon Technologies AG
  • 当前专利权人: Infineon Technologies AG
  • 当前专利权人地址: DE
  • 代理机构: Altera Law Group, LLC
  • 代理商 Jeffrey R. Stone
  • 优先权: DE10048960 20001004
  • 国际申请: PCT/DE01/03792 WO 20011004
  • 国际公布: WO02/29863 WO 20020411
  • 主分类号: H01L21/20
  • IPC分类号: H01L21/20 H01L21/4763
Method for fabricating a microelectronic circuit including applying metal over and thickening the integrated coil to increase conductivity
摘要:
A method for fabricating a microelectronic circuit having an improved electrically conductive element. The method includes providing a finished processed microelectronic circuit having a monolithically integrated coil and having a passivation layer situated above at least the monolithically integrated coil. The method further comprises removing at least part of the passivation layer above the monolithically integrated coil and applying a metal layer above the monolithically integrated coil so that the metal layer is electrically coupled to the monolithically integrated coil.
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