发明授权
- 专利标题: Fail judging method and analyzer
- 专利标题(中): 故障判断方法和分析仪
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申请号: US10496041申请日: 2002-11-18
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公开(公告)号: US07008525B2公开(公告)日: 2006-03-07
- 发明人: Yoshimitsu Morita , Yoshimi Oura , Teppei Shinno
- 申请人: Yoshimitsu Morita , Yoshimi Oura , Teppei Shinno
- 申请人地址: JP Kyoto JP Osaka
- 专利权人: Arkray, Inc.,Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Arkray, Inc.,Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JP Kyoto JP Osaka
- 代理机构: Hamre, Schumann, Mueller & Larson P.C.
- 优先权: JP2001-355323 20011120
- 国际申请: PCT/JP02/12034 WO 20021118
- 国际公布: WO03/044513 WO 20030530
- 主分类号: G01N27/327
- IPC分类号: G01N27/327
摘要:
An analyzer (A) includes a current measurer (42) for measuring the current flowing between paired electrodes (22a), (22b) when a sample is introduced to the reagent layer (23) of a sensor (2) and voltage is applied across the electrodes, while also including a processor (3) for analyzing the sample based on the current after a predetermined reference time point. The analyzer (A) further includes a fail determiner (44) which monitors the change of the current before and after the reference time point and determines that the sensor (2) is improper when the current change does not correspond to a predetermined current change.
公开/授权文献
- US20050067301A1 Fail judging method and analyzer 公开/授权日:2005-03-31
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