发明授权
US07009538B1 High-speed DAC linearity measurement 失效
高速DAC线性度测量

  • 专利标题: High-speed DAC linearity measurement
  • 专利标题(中): 高速DAC线性度测量
  • 申请号: US11015958
    申请日: 2004-12-16
  • 公开(公告)号: US07009538B1
    公开(公告)日: 2006-03-07
  • 发明人: Kevin M. Ferguson
  • 申请人: Kevin M. Ferguson
  • 申请人地址: US OR Beaverton
  • 专利权人: Tektronix, Inc.
  • 当前专利权人: Tektronix, Inc.
  • 当前专利权人地址: US OR Beaverton
  • 代理商 Francis I. Gray
  • 主分类号: H03M1/10
  • IPC分类号: H03M1/10
High-speed DAC linearity measurement
摘要:
A high-speed digital-to-analog converter (DAC) measurement method acquires and quantizes an analog ramp output by the DAC corresponding to a digital ramp input to produce a quantized ramp, determines a start and end of the quantized ramp, obtains a difference between the quantized ramp and an ideal ramp to produce a quantized periodic signal (triangular or sinusoidal), determines a frequency for a qualified peak from an FFT of the quantized periodic signal, produces a mask filtered periodic signal from an iFFT around the qualified peak, and determines a sample window spanning a local maximum and minimum for each period of the quantized periodic signal. The ramp step levels are the averages of the samples within each sample window. From the step levels in DAC LSB's, resolution, monotonicity, differential lineary and integral linearity are determined for the DAC.
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