- 专利标题: Embedded ROM device using substrate leakage
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申请号: US10924296申请日: 2004-08-23
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公开(公告)号: US07012006B2公开(公告)日: 2006-03-14
- 发明人: Casey Kurth , Scott Derner , Phillip G. Wald
- 申请人: Casey Kurth , Scott Derner , Phillip G. Wald
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Leffert Jay & Polglaze, P.A.
- 主分类号: H01L21/336
- IPC分类号: H01L21/336
摘要:
A ROM embedded DRAM provides ROM cells that can be programmed to a single state. The ROM cells include capacitors having a storage node. The storage node is processed to have a substantially high substrate leakage. The ROM cells, therefore, are hard programmed to a logic zero state. Bias techniques can be used to read un-programmed ROM cells accurately. As described, sense amplifier circuitry can be offset in one embodiment to default to the un-programmed state. In another embodiment, bias circuitry is coupled to bit lines to favor the un-programmed state. A differential pre-charge operation can also be used in another embodiment.
公开/授权文献
- US20050018466A1 Embedded ROM device using substrate leakage 公开/授权日:2005-01-27
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