发明授权
- 专利标题: TFT structure for high resolution digital X-ray detector
- 专利标题(中): 高分辨率数字X射线检测器的TFT结构
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申请号: US10486559申请日: 2002-12-18
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公开(公告)号: US07012259B2公开(公告)日: 2006-03-14
- 发明人: Sang-Hee Nam , Jae-Hyung Kim , Chi-Woong Mun , Hyung-won Lee , Sang-Ho Ahn , Jung-Gi Im
- 申请人: Sang-Hee Nam , Jae-Hyung Kim , Chi-Woong Mun , Hyung-won Lee , Sang-Ho Ahn , Jung-Gi Im
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: KR10-2002-0042988 20020722
- 国际申请: PCT/KR02/02392 WO 20021218
- 国际公布: WO2004/010210 WO 20040129
- 主分类号: G01T1/24
- IPC分类号: G01T1/24
摘要:
A structure of a TFT substrate for a high resolution digital x-ray detector, in which two TFT substrates are arranged to be a double substrate by overlapping each other such that an upper plate is moved ½ pixel distance with respect to a lower plate in a direction along one axis. Thus, a difference in movement between the upper and lower plates is a ½ pixel distance. Also, two virtual pixels are obtained from one pixel. Three TFT substrates are arranged to be a triple substrate by overlapping one another such that a middle plate is moved a ½ pixel distance with respect to a lower plate in a direction along an X axis and an uppermost plate is arranged by being moved a ½ pixel distance with respect to the lower plate in a direction along a Y axis. Thus, resolution is increased as data of one pixel is divided into four data to be analyzed and an measured value of a pixel of each overlapping substrate is compared.
公开/授权文献
- US20040200970A1 Tft structure for high resolution digital x-ray detector 公开/授权日:2004-10-14