Invention Grant
US07030389B2 Electron beam apparatus having electron analyzer and method of controlling lenses
有权
具有电子分析仪的电子束装置和控制透镜的方法
- Patent Title: Electron beam apparatus having electron analyzer and method of controlling lenses
- Patent Title (中): 具有电子分析仪的电子束装置和控制透镜的方法
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Application No.: US10764136Application Date: 2004-01-23
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Publication No.: US07030389B2Publication Date: 2006-04-18
- Inventor: Toshikatsu Kaneyama
- Applicant: Toshikatsu Kaneyama
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2003-14751 20030123
- Main IPC: G01K1/08
- IPC: G01K1/08 ; G01N23/00 ; G21K7/00

Abstract:
An electron beam apparatus having an electron analyzer is achieved which can control the illumination lens system by feedback without adversely affecting the imaging action even if a specimen is positioned within the magnetic field of the objective lens. The apparatus has an energy shift control module for controlling energy shift. On receiving instructions about setting of energy shift from the CPU, the control module issues an instruction for shifting the accelerating voltage to a specified value to an accelerating-voltage control module. The control module also sends information about the energy shift to an energy shift feedback control module, which calculates the feedback value and supplies information about corrections of lenses and deflection coils to a TEM optics control module. The feedback value is multiplied by a corrective coefficient that can be calibrated.
Public/Granted literature
- US20040188608A1 Electron beam apparatus having electron analyzer and method of controlling lenses Public/Granted day:2004-09-30
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