发明授权
US07031858B1 Method and circuit for DC measurement of phase uniformity of multi-phase clocks 有权
多相时钟相位均匀性的直流测量方法和电路

  • 专利标题: Method and circuit for DC measurement of phase uniformity of multi-phase clocks
  • 专利标题(中): 多相时钟相位均匀性的直流测量方法和电路
  • 申请号: US10439446
    申请日: 2003-05-16
  • 公开(公告)号: US07031858B1
    公开(公告)日: 2006-04-18
  • 发明人: Eric LeeGyudong Kim
  • 申请人: Eric LeeGyudong Kim
  • 申请人地址: US CA Sunnyvale
  • 专利权人: Silicon Image, Inc.
  • 当前专利权人: Silicon Image, Inc.
  • 当前专利权人地址: US CA Sunnyvale
  • 代理机构: Girard & Equitz LLP
  • 主分类号: G01R13/00
  • IPC分类号: G01R13/00
Method and circuit for DC measurement of phase uniformity of multi-phase clocks
摘要:
Methods and circuits for measuring clock phase uniformity of multi-phase clock set, including by generating at least one DC phase difference signal such that the DC phase difference signal is, or the DC phase difference signals are, indicative of the phase difference between the clocks of each of multiple pairs of clocks of the clock set, and methods and circuitry for generating such DC phase difference signals. Preferably, multiplexer circuitry asserts to DC signal generation circuitry any selected one of a number of pairs of clocks of the clock set, and the DC signal generation circuitry includes logic (for generating a binary signal in response to each clock pair) and a low pass filter for generating a DC phase difference signal in response to the binary signal. Other aspects are receivers and transmitters that include circuitry for generating at least one DC phase difference signal, and systems including at least one such transmitter (or receiver) and a link (e.g., a multi-channel or single-channel serial link) coupled thereto.
信息查询
0/0