- 专利标题: Method of assaying fluorite sample and method of producing fluorite crystal
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申请号: US10187799申请日: 2002-07-03
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公开(公告)号: US07035306B2公开(公告)日: 2006-04-25
- 发明人: Kenji Ookubo
- 申请人: Kenji Ookubo
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2001-205469 20010705
- 主分类号: H01S3/131
- IPC分类号: H01S3/131
摘要:
Disclosed is a method of performing assay to a fluorite sample, which includes a first step for dissolving a fluorite sample, containing Ca and F, by use of a solvent, a second step for removing Ca and F from an obtained solution, and a third step for assaying, through ICP-MS, the solution having Ca and F removed therefrom. Also disclosed is a method of producing a fluorite crystal and an exposure apparatus using such fluorite crystal, and a device manufacturing method using such exposure apparatus. The assaying method of the present invention ensures assay and evaluation of a fluorite sample, of sensitivity several times higher than conventional methods.
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