发明授权
- 专利标题： Testing method for a head IC
- 专利标题（中）： 头IC的测试方法
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申请号： US10659624申请日： 2003-09-10
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公开(公告)号： US07051423B2公开(公告)日： 2006-05-30
- 发明人: Akio Gouo
- 申请人： Akio Gouo
- 申请人地址： JP Kawasaki
- 专利权人： Fujitsu Limited
- 当前专利权人： Fujitsu Limited
- 当前专利权人地址： JP Kawasaki
- 代理机构： Greer, Burns & Crain, Ltd.
- 优先权： JP2000-128517 20000427
- 主分类号： G11B5/127
- IPC分类号： G11B5/127 ; H04R31/00
摘要：
This invention relates to a testing method for a head IC which makes it possible to simplify checking of the head. The head IC is installed on a head suspension, and probes are placed on terminals of the head suspension to check electric characteristics of the head IC. With this invention, contact of the probes for checking the head IC when the head IC has been installed, but before installing the head, becomes easier.
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