发明授权
- 专利标题: Measuring machine
- 专利标题(中): 测量机
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申请号: US10823459申请日: 2004-04-13
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公开(公告)号: US07051448B2公开(公告)日: 2006-05-30
- 发明人: Katsuyuki Ogura
- 申请人: Katsuyuki Ogura
- 申请人地址: JP Kawasaki
- 专利权人: Mitutoyo Corporation
- 当前专利权人: Mitutoyo Corporation
- 当前专利权人地址: JP Kawasaki
- 代理机构: Rankin, Hill, Porter & Clark LLP
- 优先权: JP2003-110329 20030415
- 主分类号: G01B5/004
- IPC分类号: G01B5/004
摘要:
A guide rail (21) having a guide surface for guiding sliding movement of a movable body (5) is monolithically formed on a base (2) of a measuring machine (1). A coating film for rust prevention is formed on the guide surface. With this feature, it is not necessary to attach the guide rail (21) as a discrete member to the base (2), so that a number of steps in the manufacture process and the production cost can be reduced. Further as the base (2) and the guide rail (21) are made of the same material, the bimetal effect does not occur, which insures the stability of the base (2) against changes due to aging.
公开/授权文献
- US20040205974A1 Measuring machine 公开/授权日:2004-10-21
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