Invention Grant
- Patent Title: Abnormality determination and estimation method for product of plastic working, and an abnormality determination and estimation device
- Patent Title (中): 塑料加工产品的异常判定和估计方法,异常判定和估计装置
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Application No.: US10859482Application Date: 2004-06-02
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Publication No.: US07054789B2Publication Date: 2006-05-30
- Inventor: Masuaki Murao , Yasuhiro Onishi
- Applicant: Masuaki Murao , Yasuhiro Onishi
- Applicant Address: JP Kariya JP Osaka
- Assignee: DENSO Corporation,Yonekura Mfg. Co., Ltd.
- Current Assignee: DENSO Corporation,Yonekura Mfg. Co., Ltd.
- Current Assignee Address: JP Kariya JP Osaka
- Agency: Harness, Dickey & Pierce PLC
- Priority: JP2003-157002 20030602
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G06F15/00 ; G21C17/00

Abstract:
The abnormality determination and estimation device (200a) estimates the presence or absence of an abnormality of the product of plastic working with respect to an elastic wave in processing of a non-defective product, based on a first elastic wave A1 that is an elastic wave generated in a processing step immediately before an upper die comes into contact with a lower die after the beginning of plastic working, a second elastic wave A2 that is an elastic wave generated in a processing step when the upper die comes into contact with the lower die, and a third elastic wave A3 that is an elastic wave generated in a processing step after the upper die comes into contact with the lower die. This makes it possible to improve the precision of abnormality detection and discriminate the abnormalities.
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