发明授权
US07055112B2 Method for automatically defining a part model for semiconductor components 有权
自动定义半导体元器件型号的方法

Method for automatically defining a part model for semiconductor components
摘要:
The present invention provides a method for automatically defining a part model for a semiconductor component. An image of the component is provided. The automatic method may be any of a trial and error method, systematic method or a method based on distance-angle signatures. The trial and error method is described in the context of defining a part model for a ball grid array. The systematic approach is described in the context of a leaded semiconductor, and the distance angle signature approach is described in the context of defining a part model for an odd form semiconductor component.
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