发明授权
- 专利标题： Shielded probe for testing a device under test
- 专利标题（中）： 用于测试被测设备的屏蔽探头
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申请号： US10445174申请日： 2003-05-23
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公开(公告)号： US07057404B2公开(公告)日： 2006-06-06
- 发明人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
- 申请人： K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
- 申请人地址： US WA Camas
- 专利权人： Sharp Laboratories of America, Inc.
- 当前专利权人： Sharp Laboratories of America, Inc.
- 当前专利权人地址： US WA Camas
- 代理机构： Chernoff, Vilhauer, McClung & Stenzel
- 主分类号： G01R31/02
- IPC分类号： G01R31/02
摘要：
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path between the first and second sides of a substrate and a probe contact electrically connected to the conductive path.
公开/授权文献
- US20050099191A1 Probe for testing a device under test 公开/授权日：2005-05-12
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