发明授权
- 专利标题: High speed linear half-rate phase detector
- 专利标题(中): 高速线性半速相位检测器
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申请号: US10823060申请日: 2004-04-13
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公开(公告)号: US07057418B1公开(公告)日: 2006-06-06
- 发明人: Wei Fu , Sudhaker Reddy Anumula , Hongwen Lu , Joseph J. Balardeta
- 申请人: Wei Fu , Sudhaker Reddy Anumula , Hongwen Lu , Joseph J. Balardeta
- 申请人地址: US CA San Diego
- 专利权人: Applied Micro Circuits Corporation
- 当前专利权人: Applied Micro Circuits Corporation
- 当前专利权人地址: US CA San Diego
- 代理机构: INCAPLAW
- 代理商 Terrance A. Meador
- 主分类号: G01R25/00
- IPC分类号: G01R25/00
摘要:
A high-speed, half rate phase detector provides an effective solution to the problem of XOR gate response to the minimum width signal precursors (Q1 and Q2) of a phase signal that indicates a phase difference between a data signal and a clock signal by combining the precursor signals in a multiplexer and combining the multiplexed signal with the data signal in an XOR gate. This affords the transition information in the transitions of the precursor signals, which is significant of phase difference, without requiring the XOR gate to respond to the minimum widths of those pulses.
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