Leakage current in logic circuitry is managed by coupling and decoupling the voltage potentials of the power supply from circuitry with large high leakage devices. Driver circuits comprise a low leakage logic path for holding logic states of the output. A high leakage logic path in parallel with the low leakage logic path is used to assert each logic state in the forward direction from input to output. The large output device in each high leakage path that enhances the current drive of a logic state on the output are leakage stress relieved by allowing their drive inputs to collapse after the output logic state has been asserted. The high leakage logic paths employ multiple stages with collapsing logic states that are generated in response to asserted logic states on the output and logic states of the low leakage logic path thus reducing the device sizes needed to control leakage.