Invention Grant
US07068559B2 Word line enable timing determination circuit of a memory device and methods of determining word line enable timing in the memory device
失效
存储器件的字线使能定时确定电路以及在存储器件中确定字线使能定时的方法
- Patent Title: Word line enable timing determination circuit of a memory device and methods of determining word line enable timing in the memory device
- Patent Title (中): 存储器件的字线使能定时确定电路以及在存储器件中确定字线使能定时的方法
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Application No.: US10950478Application Date: 2004-09-28
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Publication No.: US07068559B2Publication Date: 2006-06-27
- Inventor: Hyun-Suk Lee , Kyung-Woo Nam
- Applicant: Hyun-Suk Lee , Kyung-Woo Nam
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co. Ltd.
- Current Assignee: Samsung Electronics Co. Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness Dickey & Pierce, P.L.C.
- Priority: KR2002-40593 20020712
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A word line enable timing determination circuit of a memory device and method of determining word line enable timing in a memory device may be configured to adjust enable timing at which to activate a word line for at least one read/write command input to the memory device. This may be based on whether the memory device is performing a hidden refresh operation. In an example, and when a read/write command is input to the memory device, a word line for the read/write command may be activated after a first delay if the memory device is not executing a hidden refresh operation. Otherwise, a word line for the read/write command is activated after a second delay.
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