Invention Grant
- Patent Title: Shape measuring device and shape measuring method
- Patent Title (中): 形状测量装置和形状测量方法
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Application No.: US10927536Application Date: 2004-08-27
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Publication No.: US07078688B2Publication Date: 2006-07-18
- Inventor: Masato Kazui , Mitsuji Ikeda , Atsushi Takane
- Applicant: Masato Kazui , Mitsuji Ikeda , Atsushi Takane
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2003-302265 20030827
- Main IPC: H01J37/28
- IPC: H01J37/28 ; G01N23/203

Abstract:
This invention is to provide a shape measuring device and a shape measuring method that can accurately measure a cross-sectional shape or a three-dimensional shape of a sample without using matching of characteristics. A shape measuring apparatus comprises a charged particle beam apparatus comprising a processor for measuring detected charged particles signal generated from the sample. The charged particle beam is irradiated to sample at first angle to generate a first signal and second angle to generate second signal. The processor selects a parameter indicating a relation between the first signal and a height of the sample or an inclination angle of the specimen until the first signal which achieves the second signal.
Public/Granted literature
- US20050061973A1 Shape measuring device and shape measuring method Public/Granted day:2005-03-24
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