- 专利标题: Control of temperature of flat panel type of radiation detector
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申请号: US11006593申请日: 2004-12-08
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公开(公告)号: US07078703B2公开(公告)日: 2006-07-18
- 发明人: Naoto Watanabe
- 申请人: Naoto Watanabe
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2001-197648 20010629
- 主分类号: G01T1/17
- IPC分类号: G01T1/17
摘要:
A radiation detector is realized as, for example, a flat panel detector (FPD) for two-dimensionally detecting X-rays. The detector comprises a detection board and a control unit. The detection board on which a plurality of detection elements for detecting a radiation are two-dimensionally disposed in a matrix and circuits for collecting signals from the detection elements. The control unit for controlling the detection board so that the detection board is placed in a predetermined temperature state. The predetermined temperature state is defined, for example, as predetermined ranges of temperatures used during the operation and the non-operation states of the detector, respectively. This radiation detector can be mounted in a radiography system such as an X-ray radiography system.
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