发明授权
- 专利标题: Method and apparatus for detecting kissing unbond defects
- 专利标题(中): 检测无粘连缺陷的方法和装置
-
申请号: US09453319申请日: 1999-12-02
-
公开(公告)号: US07083327B1公开(公告)日: 2006-08-01
- 发明人: Steven M. Shepard
- 申请人: Steven M. Shepard
- 申请人地址: US MI Ferndale
- 专利权人: Thermal Wave Imaging, Inc.
- 当前专利权人: Thermal Wave Imaging, Inc.
- 当前专利权人地址: US MI Ferndale
- 代理机构: Honigman Miller Schwartz and Cohn LLP
- 主分类号: G01N25/72
- IPC分类号: G01N25/72 ; G01N3/00 ; G01J5/10
摘要:
A active thermographic method for detecting subsurface defects in a specimen, particularly kissing unbond defects, includes heating a specimen, applying a force to the surface of the specimen to shift and separate the walls of the defect, and obtaining thermographic images of the specimen over time to monitor the heat flow through the specimen and detect thermal discontinuities. Because kissing unbond defects normally have good physical contact, and therefore good thermal conductivity, between its walls, these defects can go undetected in conventional active thermographic methods. By distorting the surface of the specimen, the kissing unbond defect is enlarged enough to generate sufficient thermal contrast for the defect to appear in the thermographic images.
信息查询