发明授权
US07088450B2 Method and apparatus for measuring amplified stimulated emission in the output of a master oscillator power amplifier system
失效
用于测量主振荡器功率放大器系统的输出中的放大的受激发射的方法和装置
- 专利标题: Method and apparatus for measuring amplified stimulated emission in the output of a master oscillator power amplifier system
- 专利标题(中): 用于测量主振荡器功率放大器系统的输出中的放大的受激发射的方法和装置
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申请号: US10806847申请日: 2004-03-23
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公开(公告)号: US07088450B2公开(公告)日: 2006-08-08
- 发明人: Sergei V. Govorkov , Tamas Nagy , Gongxue Hua
- 申请人: Sergei V. Govorkov , Tamas Nagy , Gongxue Hua
- 申请人地址: US CA Santa Clara
- 专利权人: Coherent, Inc.
- 当前专利权人: Coherent, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Stallman & Pollock LLP
- 主分类号: G01B9/02
- IPC分类号: G01B9/02
摘要:
A method for measuring amplified spontaneous emission (ASE) content in a beam of laser radiation emitted by a laser master oscillator power-amplifier system comprises directing the beam of light into a two-beam interferometer having unequal beam path lengths. The two beams interfering in the interferometer have equal amplitude and form a pattern of interference fringes. The beam-path difference is arranged to be greater than the coherence length of the ASE so that the ASE content of the beam does not form interference fringes but provides a background level of light in the interference pattern. This enables the ASE content of the beam to be determined from measurements of the maximum intensity of a bright fringe and the minimum energy of a dark fringe in the interference pattern.
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