Invention Grant
US07092017B2 Fixed pattern noise removal in CMOS imagers across various operational conditions
有权
在各种操作条件下,CMOS成像器中的固定图案噪声去除
- Patent Title: Fixed pattern noise removal in CMOS imagers across various operational conditions
- Patent Title (中): 在各种操作条件下,CMOS成像器中的固定图案噪声去除
-
Application No.: US10242865Application Date: 2002-09-13
-
Publication No.: US07092017B2Publication Date: 2006-08-15
- Inventor: Sean C. Kelly , Robert M. Guidash , Bruce H. Pillman
- Applicant: Sean C. Kelly , Robert M. Guidash , Bruce H. Pillman
- Applicant Address: US NY Rochester
- Assignee: Eastman Kodak Company
- Current Assignee: Eastman Kodak Company
- Current Assignee Address: US NY Rochester
- Agent Peyton C. Watkins
- Main IPC: H04N5/217
- IPC: H04N5/217 ; G06K9/40

Abstract:
CMOS imagers can possess higher levels of imager noise than their predecessors, CCDs. This noise can be of the form of temporal variation and fixed pattern. The fixed pattern component of this noise can be removed, which is known already in the art. The invention in this disclosure is that proper correction can be developed for all imager conditions (imager integration time and imager temperature) using a single FPN (fixed pattern noise) dark map, a single FPN PRNU (pixel response nonuniformity) map, imager integration time and imager temperature. Without this invention, a dark frame capture and a flat field capture (integrating sphere), are required before every image capture, a practical impossibility in typical picture taking. Further, the estimates of both FPN maps (dark and PRNU) in this invention are improved estimates relative to such captured directly preceding image capture since such have be formed with multiple frame averaging at calibration time, thus removing any temporal noise from these map estimates. These dark FPN and PRNU FPN maps are modified by a scaling and biasing functional with the measured values of integration time and of imager temperature. A second approach is to make the biasing and scaling functions dependant only on mean dark response taken from the imager's dark pixels, at time of capture.
Public/Granted literature
- US20040051797A1 Fixed pattern noise removal in CMOS imagers across various operational conditions Public/Granted day:2004-03-18
Information query