发明授权
- 专利标题: Ultrasonic flaw detecting method and ultrasonic flaw detector
- 专利标题(中): 超声波探伤法和超声波探伤仪
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申请号: US11049949申请日: 2005-02-04
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公开(公告)号: US07093490B2公开(公告)日: 2006-08-22
- 发明人: Naoyuki Kono , Tetsuya Matsui , Masahiro Koike , Masahiro Tooma , Yoshinori Musha , Masahiro Miki
- 申请人: Naoyuki Kono , Tetsuya Matsui , Masahiro Koike , Masahiro Tooma , Yoshinori Musha , Masahiro Miki
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly, Stanger, Malur & Brundidge, P.C.
- 优先权: JP2004-046583 20040223
- 主分类号: G01N9/24
- IPC分类号: G01N9/24
摘要:
In order to make it possible in ultrasonic flaw detection to generate ultrasonic waves containing a main beam only by use of an array probe and clearly identify a defect in a specimen by use of images, an element pitch P (the distance between centers of adjacent ultrasonic transducer elements in the array probe) is set longer than ¼ of the wavelength of longitudinal waves generated by the ultrasonic transducer elements and shorter than ½ of the wavelength and reception signals up to time corresponding to the sum of wall thickness round-trip propagation time for longitudinal waves and wall thickness round-trip propagation time for shear waves in the specimen are displayed.
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