发明授权
US07108979B2 Methods to detect cross-contamination between samples contacted with a multi-array substrate
失效
检测与多阵列基板接触的样品之间的交叉污染的方法
- 专利标题: Methods to detect cross-contamination between samples contacted with a multi-array substrate
- 专利标题(中): 检测与多阵列基板接触的样品之间的交叉污染的方法
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申请号: US10655430申请日: 2003-09-03
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公开(公告)号: US07108979B2公开(公告)日: 2006-09-19
- 发明人: Joseph P. Fredrick , Jacqueline M. Tso
- 申请人: Joseph P. Fredrick , Jacqueline M. Tso
- 申请人地址: US CA Palo Alto
- 专利权人: Agilent Technologies, Inc.
- 当前专利权人: Agilent Technologies, Inc.
- 当前专利权人地址: US CA Palo Alto
- 主分类号: C12Q1/68
- IPC分类号: C12Q1/68 ; C07H21/02 ; C07H21/04
摘要:
Methods and compositions for detecting cross-contamination between samples contacted with different arrays of a multi-array substrate are provided. The methods involve contacting sample to arrays of a multi-array substrate that contains cross-contamination probes in each of its arrays, and evaluating the resultant sample contacted arrays for cross-contamination between the samples. In many embodiments, the arrays of the multi-array substrate contain a set of cross-contamination probes for a corresponding set of cross-contamination targets in the sample(s). Kits and systems are provided for performing the invention. The subject methods may be used in a variety of different applications, such as gene expression analysis, DNA sequencing, mutation detection, as well as other genomics and proteomics applications.