Invention Grant
- Patent Title: Centering device, in particular for a probe measuring device
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Application No.: US10537867Application Date: 2003-12-12
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Publication No.: US07111410B2Publication Date: 2006-09-26
- Inventor: Franz Haimer
- Applicant: Franz Haimer
- Applicant Address: DE Hollenbach-Igenhausen
- Assignee: Franz Haimer Maschinenbau KG
- Current Assignee: Franz Haimer Maschinenbau KG
- Current Assignee Address: DE Hollenbach-Igenhausen
- Agency: Edwards Angell Palmer & Dodge LLP
- Agent Scott D. Wofsy
- Priority: DE10258448 20021213
- International Application: PCT/EP03/14142 WO 20031212
- International Announcement: WO2004/055470 WO 20040701
- Main IPC: G01B5/20
- IPC: G01B5/20

Abstract:
A centering device, in particular for a tracer-type measuring instrument (1), is proposed. The centering device comprises an instrument carrier (3) defining an instrument axis (7), a carrying shank (41) defining a shank axis (43) and a centering holder (45) holding the instrument carrier (3), with the instrument axis (7) parallel to the shank axis (43), radially movably to the latter, but so as to be capable of being fixed to the carrying shank (41). The centering holder (45) is designed as a parallelogram guide with a parallelogram-link region (59), or a plurality of these regions, distributed about the shank axis (43) and the instrument axis (47) and extending along these axes (7, 43). Such a parallelogram guide may be integrally formed in one piece on the carrying shank (41) and/or on the instrument carrier (3), thus reducing the outlay in terms of production. Setscrews (69) distributed on the circumference of the parallelogram guide make it possible to adjust the shank axis (43) in relation to the instrument axis (7).
Public/Granted literature
- US20060048402A1 Centering device, in particular for a probe measuring device Public/Granted day:2006-03-09
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