Invention Grant
US07114265B2 Apparatus for detecting the position of a probe element in a multi-coordinate measuring device 有权
用于检测多坐标测量装置中的探针元件的位置的装置

  • Patent Title: Apparatus for detecting the position of a probe element in a multi-coordinate measuring device
  • Patent Title (中): 用于检测多坐标测量装置中的探针元件的位置的装置
  • Application No.: US10802212
    Application Date: 2004-03-17
  • Publication No.: US07114265B2
    Publication Date: 2006-10-03
  • Inventor: Georg Mies
  • Applicant: Georg Mies
  • Applicant Address: DE Hueckeswagen
  • Assignee: Klingelnberg GmbH
  • Current Assignee: Klingelnberg GmbH
  • Current Assignee Address: DE Hueckeswagen
  • Agency: McCormick, Paulding & Huber LLP
  • Priority: DE10313038 20030324
  • Main IPC: G01B5/004
  • IPC: G01B5/004 G01D5/347
Apparatus for detecting the position of a probe element in a multi-coordinate measuring device
Abstract:
The invention is directed to a device for direct detection of the spatial position of a probe element in a multi-coordinate measuring apparatus, with a reference system comprised of at least one first standard and one second standard that are associated with coordinate axes of the measuring apparatus. The first standard is a planar standard with a line grating array. The second standard is non-contacting relative to the first standard and movable in two dimensions by means of a cross slide. Provision is made for a first position measuring system for determining the spatial position of the second standard with respect to the first standard, and for a second position measuring system for determining the spatial position of a carriage carrying a three-dimensional probe assembly, with respect to the second standard. The device forms in an associated multi-coordinate measuring apparatus a continuous measuring chain from the first standard to the tip of the probe element. This supplies directly a measurement result considering any guide inaccuracies, without the need to perform any path corrections.
Information query
Patent Agency Ranking
0/0