发明授权
US07114265B2 Apparatus for detecting the position of a probe element in a multi-coordinate measuring device 有权
用于检测多坐标测量装置中的探针元件的位置的装置

  • 专利标题: Apparatus for detecting the position of a probe element in a multi-coordinate measuring device
  • 专利标题(中): 用于检测多坐标测量装置中的探针元件的位置的装置
  • 申请号: US10802212
    申请日: 2004-03-17
  • 公开(公告)号: US07114265B2
    公开(公告)日: 2006-10-03
  • 发明人: Georg Mies
  • 申请人: Georg Mies
  • 申请人地址: DE Hueckeswagen
  • 专利权人: Klingelnberg GmbH
  • 当前专利权人: Klingelnberg GmbH
  • 当前专利权人地址: DE Hueckeswagen
  • 代理机构: McCormick, Paulding & Huber LLP
  • 优先权: DE10313038 20030324
  • 主分类号: G01B5/004
  • IPC分类号: G01B5/004 G01D5/347
Apparatus for detecting the position of a probe element in a multi-coordinate measuring device
摘要:
The invention is directed to a device for direct detection of the spatial position of a probe element in a multi-coordinate measuring apparatus, with a reference system comprised of at least one first standard and one second standard that are associated with coordinate axes of the measuring apparatus. The first standard is a planar standard with a line grating array. The second standard is non-contacting relative to the first standard and movable in two dimensions by means of a cross slide. Provision is made for a first position measuring system for determining the spatial position of the second standard with respect to the first standard, and for a second position measuring system for determining the spatial position of a carriage carrying a three-dimensional probe assembly, with respect to the second standard. The device forms in an associated multi-coordinate measuring apparatus a continuous measuring chain from the first standard to the tip of the probe element. This supplies directly a measurement result considering any guide inaccuracies, without the need to perform any path corrections.
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