发明授权
- 专利标题: Lithographic apparatus and device manufacturing method
- 专利标题(中): 平版印刷设备和器件制造方法
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申请号: US10986181申请日: 2004-11-12
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公开(公告)号: US07119346B2公开(公告)日: 2006-10-10
- 发明人: Hendrik Antony Johannes Neerhof , Gert-Jan Heerens
- 申请人: Hendrik Antony Johannes Neerhof , Gert-Jan Heerens
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 优先权: EP03257165 20031113
- 主分类号: A61N5/00
- IPC分类号: A61N5/00
摘要:
A lithographic apparatus is provided. The apparatus includes an illumination system for conditioning a beam of radiation, and a support for supporting a patterning device. The patterning device serves to impart the beam of radiation with a pattern in its cross-section. The apparatus also includes a substrate table for holding a substrate, a projection system for projecting the patterned beam onto a target portion of the substrate, and a high voltage conductor in a part of the apparatus that is evacuated or at a low pressure during normal use of the apparatus. The conductor is coated by an isolation layer having a conductivity that is high enough to prevent charge build-up on the outside thereof during use of the apparatus, and low enough to limit peak current flow during a breakdown.
公开/授权文献
- US20050151096A1 Lithographic apparatus and device manufacturing method 公开/授权日:2005-07-14
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