Invention Grant
- Patent Title: System and method for analyzing an image
- Patent Title (中): 用于分析图像的系统和方法
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Application No.: US09891569Application Date: 2001-06-25
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Publication No.: US07127100B2Publication Date: 2006-10-24
- Inventor: Lothar Wenzel , Dinesh Nair , Ram Rajagopal
- Applicant: Lothar Wenzel , Dinesh Nair , Ram Rajagopal
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark S. Williams
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A system and method for analyzing an image. The system may comprise a computer which includes a CPU and a memory medium which is operable to store one or more programs executable by the CPU to perform the method. The method may include: 1) receiving data describing an n-dimensional image, wherein the image is defined in a bounded n-dimensional space, wherein the image is embedded in an m-dimensional real space via an embedding function x( ), and wherein m>n; 2) determining a diffeomorphism (f,g) of the n-dimensional space; 3) computing the inverse transform (f−1,g−1) of the determined diffeomorphism (f,g); 4) selecting a plurality of points in the n-dimensional space; 5) mapping the plurality of points onto the image using x(f−1,g−1) thereby generating a mapped plurality of points on the image; and 6) analyzing the mapped plurality of points to determine characteristics of the image.
Public/Granted literature
- US20030031357A1 System and method for analyzing an image Public/Granted day:2003-02-13
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