发明授权
- 专利标题: Mass spectrometer
- 专利标题(中): 质谱仪
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申请号: US11126218申请日: 2005-05-11
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公开(公告)号: US07129478B2公开(公告)日: 2006-10-31
- 发明人: Takashi Baba , Hiroyuki Satake , Yasuaki Takada
- 申请人: Takashi Baba , Hiroyuki Satake , Yasuaki Takada
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Reed Smith LLP
- 代理商 Stanley P. Fisher, Esq.; Juan Carlos A. Marquez, Esq.
- 优先权: JP2004-152835 20040524
- 主分类号: B01D59/44
- IPC分类号: B01D59/44 ; H01J49/00
摘要:
A mass spectrometer having an ion source section capable of creating positive ions and negative ions at high efficiency. The ion source is comprised of an ion source section for creating ions of a sample gas, a mass spectrometric section for conducting mass separation of created ions, linear RF generating multipole electrodes, magnetic fields generation means, a sample gas introduction system, a reaction gas introduction system and an electron source in which the linear RF generating multipole electrodes generate linear RF multipole electric fields. A static magnetic fields is applied in parallel on the center axis where the linear RF multipole electric fields are zero. A sample gas and a reagent gas are introduced into the ion source section. Electrons are injected for creating reaction of the positive ions or negative ions.
公开/授权文献
- US20050258354A1 Mass spectrometer 公开/授权日:2005-11-24