Invention Grant
- Patent Title: Tri-metal and dual-metal stacked inductors
- Patent Title (中): 三金属和双金属堆叠电感器
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Application No.: US10707065Application Date: 2003-11-19
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Publication No.: US07129561B2Publication Date: 2006-10-31
- Inventor: Douglas D. Coolbaugh , Daniel C. Edelstein , Robert A. Groves , Zhong-Xiang He
- Applicant: Douglas D. Coolbaugh , Daniel C. Edelstein , Robert A. Groves , Zhong-Xiang He
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent William D. Sabo, Esq.
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01F5/00

Abstract:
A high performance inductor which has a relatively low sheet resistance that can be integrated within a semiconductor interconnect structure and can be used in RF applications, including RF CMOS and SiGe technologies, is provided. The inductor is either a dual-metal inductor including a first layer of metal which serves as an upper metal wire in the semiconductor structure and a second layer of metal located directly on top of the first layer of metal, or a tri metal inductor, which includes a third layer of metal located directly on top of the second layer of metal. No vias are located between the various metal layers of the inventive inductor.
Public/Granted literature
- US20050104157A1 TRI-METAL AND DUAL-METAL STACKED INDUCTORS Public/Granted day:2005-05-19
Information query
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