发明授权
- 专利标题: General techniques for diagnosing data corruptions
- 专利标题(中): 诊断数据损坏的一般技术
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申请号: US10329077申请日: 2002-12-23
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公开(公告)号: US07133883B2公开(公告)日: 2006-11-07
- 发明人: Nisha D. Talagala , Brian Wong
- 申请人: Nisha D. Talagala , Brian Wong
- 申请人地址: US CA Santa Clara
- 专利权人: Sun Microsystems, Inc.
- 当前专利权人: Sun Microsystems, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Dorsey & Whitney LLP
- 主分类号: G06F17/30
- IPC分类号: G06F17/30 ; G06F12/00
摘要:
Diagnosis of corruption in interrelated data entities uses a graph of nodes and edges. Datum nodes represent the data entities, relationship nodes represent the relationships among the data entities. The datum nodes are connected through their relationship nodes by the edges. When corruption is detected, the relationships are analyzed and each edge connecting a datum node to a relationship node is removed from the graph when the corresponding relationship is invalid. The datum nodes that remain connected to their relationship nodes form a subgraph and the corresponding data entities are considered correct. In one aspect, if more than one subgraph is formed, the datum nodes in the largest are used. In another aspect, the data entities and relationships are analyzed to create the graph when the data entities are assumed correct. The data entities may be data and metadata of various types that can be associated with the data.
公开/授权文献
- US20040133539A1 General techniques for diagnosing data corruptions 公开/授权日:2004-07-08
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