发明授权
- 专利标题: Chemical vapor deposition method using alcohol for forming metal oxide thin film
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申请号: US10355221申请日: 2003-01-31
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公开(公告)号: US07135207B2公开(公告)日: 2006-11-14
- 发明人: Yo-sep Min , Young-jin Cho , Jung-hyun Lee
- 申请人: Yo-sep Min , Young-jin Cho , Jung-hyun Lee
- 申请人地址: KR Suwon
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon
- 代理机构: Buchanan Ingersoll & Rooney PC
- 优先权: KR2002-18026 20020402
- 主分类号: C23C16/18
- IPC分类号: C23C16/18
摘要:
Provided is a method for fabricating a metal oxide thin film in which a metal oxide generated by a chemical reaction between a first reactant and a second reactant is deposited on the surface of a substrate as a thin film. The method involves introducing a first reactant containing a metal-organic compound into a reaction chamber including a substrate; and introducing a second reactant containing alcohol. Direct oxidation of a substrate or a deposition surface is suppressed by a reactant gas during the deposition process, as it uses alcohol vapor including no radical oxygen as a reactant gas for the deposition of a thin film. Also, since the thin film is deposited by the thermal decomposition, which is caused by the chemical reaction between the alcohol vapor and a precursor, the deposition rate is fast. Particularly, the deposition rate is also fast when a metal-organic complex with β-diketone ligands is used as a precursor. Further, a thin film with low leakage current can be obtained as the metal oxide thin film fabrication method using a chemical vapor deposition or atomic layer deposition method grows a thin film with fine microstructure.
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