Invention Grant
- Patent Title: Electrical magnetic interference test system
- Patent Title (中): 电磁干扰试验系统
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Application No.: US11179564Application Date: 2005-07-13
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Publication No.: US07141962B2Publication Date: 2006-11-28
- Inventor: Chin-Yuan Lin , Ming-Fang Wu , Pei-Chih Liu , Yu-Kuo Wang , Yi-Kai Lin , Sheng-Lee Lin
- Applicant: Chin-Yuan Lin , Ming-Fang Wu , Pei-Chih Liu , Yu-Kuo Wang , Yi-Kai Lin , Sheng-Lee Lin
- Applicant Address: TW Hsinchu
- Assignee: Avision Inc.
- Current Assignee: Avision Inc.
- Current Assignee Address: TW Hsinchu
- Agency: Rabin & Berdo, P.C.
- Priority: TW93121667A 20040720
- Main IPC: G01R23/00
- IPC: G01R23/00

Abstract:
An EMI (Electrical Magnetic Interference) test system is provided. The system includes a testing table, a horizontal antenna, a vertical antenna and a processing unit. The testing table is used for supporting an Equipment Under Test (EUT). The horizontal antenna is positioned at a first location in an EMI chamber. The vertical antenna is positioned at a second location in the EMI chamber. The vertical antenna and the horizontal antenna are used for receiving the electromagnetic wave radiated from the EUT, and producing a vertical electric wave and a horizontal electric wave respectively. The processing unit is coupled to the vertical antenna and the horizontal antenna for transforming and analyzing the vertical electric wave and the horizontal electric wave.
Public/Granted literature
- US20060017428A1 Electrical magnetic interference test system Public/Granted day:2006-01-26
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