发明授权
- 专利标题: Ultraviolet ray measuring method and ultraviolet ray measuring device
- 专利标题(中): 紫外线测量方法和紫外线测量装置
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申请号: US10961197申请日: 2004-10-12
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公开(公告)号: US07148489B2公开(公告)日: 2006-12-12
- 发明人: Shigeru Yagi
- 申请人: Shigeru Yagi
- 申请人地址: JP Tokyo
- 专利权人: Fuji Xerox Co., Ltd.
- 当前专利权人: Fuji Xerox Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 主分类号: G01J1/42
- IPC分类号: G01J1/42
摘要:
An ultraviolet ray measuring method using an ultraviolet ray receiving element having a specific spectral sensitivity. The method includes: estimating an estimated value of an entire region from the spectral sensitivity of the ultraviolet ray receiving element and a solar spectral radiation spectrum; estimating an estimated value of a specific region from a specific action curve and the spectral sensitivity and the solar spectral radiation spectrum; and determining specific ultraviolet ray information by, on the basis of the estimated value of the entire region and the estimated value of the specific region, correcting an actually measured value which is measured by the ultraviolet ray receiving element. Further, specific ultraviolet information, which is obtained on the basis of sun altitude information, is also corrected.
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