发明授权
- 专利标题: High-sensitivity measuring instrument and method of using the instrument to measure a characteristic value at a point in time
- 专利标题(中): 高灵敏度测量仪器和使用仪器在某个时间点测量特征值的方法
-
申请号: US10508225申请日: 2003-03-19
-
公开(公告)号: US07154274B2公开(公告)日: 2006-12-26
- 发明人: Yoshio Sunaoka , Shinichi Ohashi , Toshio Morita , Masashi Fujita
- 申请人: Yoshio Sunaoka , Shinichi Ohashi , Toshio Morita , Masashi Fujita
- 申请人地址: JP Tokyo
- 专利权人: Organo Corporation
- 当前专利权人: Organo Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Norris McLaughlin & Marcus PA
- 优先权: JP2002-078067 20020320
- 国际申请: PCT/JP03/03370 WO 20030319
- 国际公布: WO03/078989 WO 20030925
- 主分类号: G01N27/02
- IPC分类号: G01N27/02
摘要:
A high-sensitivity measuring instrument comprising at least two sensors for detecting the same characteristics by touching a substance being measured with a specified time difference, wherein the between detection signals taken out simultaneously from respective sensors is determined, the difference between characteristic values upon elapsing the specified time difference is determined from the difference between detection signals, a reference time of measurement and a reference characteristic value at that time are preset, a time axis having a time pitch of a specified time difference is set, and a measurement value is obtained at a point in time elapsing an arbitrary time pitch from the reference time. Objective measurement characteristics can be detected by the measuring instrument not in the form of difference or variation but as an absolute value with high accuracy and sensitivity.
公开/授权文献
- US20050110499A1 High-sensitivity measuring instrument 公开/授权日:2005-05-26
信息查询