发明授权
- 专利标题： Controlled sample environment for analytical devices
- 专利标题（中）： 分析仪器的受控样品环境
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申请号： US10296720申请日： 2001-05-30
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公开(公告)号： US07160718B2公开(公告)日： 2007-01-09
- 发明人: Carl Levoguer , Daryl R Williams , Dylan H Simpson
- 申请人： Carl Levoguer , Daryl R Williams , Dylan H Simpson
- 申请人地址： GB London
- 专利权人： Surface Measurement Systems Limited
- 当前专利权人： Surface Measurement Systems Limited
- 当前专利权人地址： GB London
- 代理机构： Pillsbury Winthrop Shaw Pittman LLC
- 国际申请： PCT/GB01/02403 WO 20010530
- 国际公布： WO01/92460 WO 20011206
- 主分类号： C12M1/36
- IPC分类号： C12M1/36
摘要：
Apparatus for examining a sample by microscopy, spectroscopy or crystallography under controlled environmental conditions. The apparatus comprises a sample chamber (1) which is fed by a gas stream (19) having a known vapor content, which is generated by mixing two gas streams (18 & 16), one substantially saturated in a volatile substance (18) and one substantially free of the volatile substance (16), in a controlled manner. The temperature of the apparatus, and particularly of the sample chamber (1), is accurately controlled and regulated by temperature controller (7).
公开/授权文献
- US20030143721A1 Controlled sample environment for analytical devices 公开/授权日：2003-07-31
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