发明授权
US07161350B2 Method for material property monitoring with perforated, surface mounted sensors
有权
具有穿孔，表面安装传感器的材料性能监测方法
- 专利标题： Method for material property monitoring with perforated, surface mounted sensors
- 专利标题（中）： 具有穿孔，表面安装传感器的材料性能监测方法
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申请号： US10633905申请日： 2003-08-04
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公开(公告)号： US07161350B2公开(公告)日： 2007-01-09
- 发明人: Neil J. Goldfine , Darrell E. Schlicker , David C. Clark , Karen E. Walrath , Volker Weiss , William M. Chepolis , Andrew P. Washabaugh , Vladimir A. Zilberstein , Vladimir Tsukernik
- 申请人： Neil J. Goldfine , Darrell E. Schlicker , David C. Clark , Karen E. Walrath , Volker Weiss , William M. Chepolis , Andrew P. Washabaugh , Vladimir A. Zilberstein , Vladimir Tsukernik
- 申请人地址： US MA Waltham
- 专利权人： Jentek Sensors, Inc.
- 当前专利权人： Jentek Sensors, Inc.
- 当前专利权人地址： US MA Waltham
- 代理机构： Hamilton, Brook, Smith & Reynolds, P.C.
- 主分类号： G01N27/90
- IPC分类号： G01N27/90 ; G01N27/82
摘要：
Material condition monitoring may be performed by electromagnetic sensors and sensor arrays mounted to the material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. They can also be mounted such that they do not significantly modify the environmental exposure conditions for the test material, such as by creating stand-off gaps between the sensor and material surface or by perforating the sensor substrate.
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