发明授权
- 专利标题: Semiconductor memory and method of testing the same
- 专利标题(中): 半导体存储器和测试方法相同
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申请号: US10387520申请日: 2003-03-14
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公开(公告)号: US07162660B2公开(公告)日: 2007-01-09
- 发明人: Hiroyuki Ogino
- 申请人: Hiroyuki Ogino
- 代理机构: Oliff & Berridge, PLC
- 优先权: JP2002-074529 20020318
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
A memory section includes an array of a plurality of memory elements, an address selecting circuit, a data selecting circuit having a data writing section for being driven for writing or reading normal data or test data, and a data reading section for generating an output to represent a positive and a negative of a read value of stored data from the memory elements. A memory controlling section includes a computing means for inputting/outputting, computing, storing, or controlling data and control information, a nonvolatile defect-and-fault recovery table used for holding an inherent history of a semiconductor memory, registering a detected defect or fault, and mapping the memory element by the unit of address or by the unit of data selection path of the memory element to a registered alternative address or data selection path, and a controlling and storing means for storing data, information for control or test, or a processing procedure.
公开/授权文献
- US20040042293A1 Semiconductor memory and method of testing the same 公开/授权日:2004-03-04