发明授权
- 专利标题: Position measuring system
- 专利标题(中): 位置测量系统
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申请号: US10840812申请日: 2004-05-07
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公开(公告)号: US07164482B2公开(公告)日: 2007-01-16
- 发明人: Ulrich Benner , Elmar Mayer , Wolfgang Holzapfel
- 申请人: Ulrich Benner , Elmar Mayer , Wolfgang Holzapfel
- 申请人地址: DE Traunreut
- 专利权人: Dr. Johannes Heidenhain GmbH
- 当前专利权人: Dr. Johannes Heidenhain GmbH
- 当前专利权人地址: DE Traunreut
- 代理机构: Brinks Hofer Gilson & Lione
- 优先权: DE10323088 20030516
- 主分类号: G01B11/14
- IPC分类号: G01B11/14
摘要:
A position measuring system that includes a scale having a measuring graduation extending along a first line and a scanning device. The scanning device includes a light source that transmits light beams that scan the measuring graduation, wherein the measuring graduation generates modified light from the transmitted light beams and a detector unit that receives the modified light from the measuring graduation. A lens arrangement, arranged between the scale and the detector unit, the lens arrangement generating a defined image of the measuring graduation on the, detector unit, wherein the defined image extends along a second line, whose curvature is different from a curvature of the first line.
公开/授权文献
- US20040227958A1 Position measuring system 公开/授权日:2004-11-18
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