发明授权
- 专利标题: Superlattice nanocrystal Si-SiO2 electroluminescence device
- 专利标题(中): 超晶格纳米晶Si-SiO2电致发光器件
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申请号: US11175797申请日: 2005-07-05
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公开(公告)号: US07166485B1公开(公告)日: 2007-01-23
- 发明人: Tingkai Li , Sheng Teng Hsu , Wei-Wei Zhuang
- 申请人: Tingkai Li , Sheng Teng Hsu , Wei-Wei Zhuang
- 申请人地址: US WA Camas
- 专利权人: Sharp Laboratories of America, Inc.
- 当前专利权人: Sharp Laboratories of America, Inc.
- 当前专利权人地址: US WA Camas
- 代理商 David C. Ripma
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L29/06
摘要:
A superlattice nanocrystal Si—SiO2 electroluminescence (EL) device and fabrication method have been provided. The method comprises: providing a Si substrate; forming an initial SiO2 layer overlying the Si substrate; forming an initial polysilicon layer overlying the initial SiO2 layer; forming SiO2 layer overlying the initial polysilicon layer; repeating the polysilicon and SiO2 layer formation, forming a superlattice; doping the superlattice with a rare earth element; depositing an electrode overlying the doped superlattice; and, forming an EL device. In one aspect, the polysilicon layers are formed by using a chemical vapor deposition (CVD) process to deposit an amorphous silicon layer, and annealing. Alternately, a DC-sputtering process deposits each amorphous silicon layer, and following the forming of the superlattice, polysilicon is formed by annealing the amorphous silicon layers. Silicon dioxide can be formed by either thermal annealing or by deposition using a DC-sputtering process.
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