Invention Grant
- Patent Title: Measuring method of spatially resolved frequency selective images
- Patent Title (中): 空间分辨率频率选择图像的测量方法
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Application No.: US11213585Application Date: 2005-08-26
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Publication No.: US07167003B2Publication Date: 2007-01-23
- Inventor: Kai Eberhardt , Michael Schär , Christoph Barmet , Peter Boesiger , Sebastian Kozerke
- Applicant: Kai Eberhardt , Michael Schär , Christoph Barmet , Peter Boesiger , Sebastian Kozerke
- Applicant Address: CH Zurich CH Zurich
- Assignee: Universitat Zurich,Eidgenossiche Technische Hochschule (E T H)
- Current Assignee: Universitat Zurich,Eidgenossiche Technische Hochschule (E T H)
- Current Assignee Address: CH Zurich CH Zurich
- Agency: Cohen, Pontani, Lieberman & Pavane
- Priority: EP04020505 20040828
- Main IPC: G01V3/00
- IPC: G01V3/00

Abstract:
The present invention describes a magnetic resonance imaging method wherein spatially resolved frequency sensitive image data are collected by means of free precession sequences employing very small radio frequency (RF) excitation pulses per unit time which result in highly frequency selective steady-state signals dominated by linear properties of the system, for which the superposition principle holds. By appropriate linear combination of steady state signals of N different frequencies, N resonance lines can be acquired simultaneously. This method allows spectroscopic recordings with very low RF power deposition which renders the method suitable for applications at high static magnetic field strengths.
Public/Granted literature
- US20060043971A1 Measuring method of spatially resolved frequency selective images Public/Granted day:2006-03-02
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