Invention Grant
- Patent Title: Optical inspection system and method for displaying imaged objects in greater than two dimensions
- Patent Title (中): 光学检查系统及其在二维以上显示成像物体的方法
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Application No.: US10393413Application Date: 2003-03-20
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Publication No.: US07171037B2Publication Date: 2007-01-30
- Inventor: James Mahon , S. Jeffrey Rosner , Izhak Baharav , Xuemei Zhang
- Applicant: James Mahon , S. Jeffrey Rosner , Izhak Baharav , Xuemei Zhang
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/68
Abstract:
A display for use in a printed circuit board inspection system for inspecting objects on a printed circuit board is capable of displaying a greater-than-two dimensional image of the shape of the surface of an object resident on the printed circuit board in at least two dimensions. The image of the object is generated based on optical imaging of the object under different illumination configurations.
Public/Granted literature
- US20040184032A1 Optical inspection system and method for displaying imaged objects in greater than two dimensions Public/Granted day:2004-09-23
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