发明授权
- 专利标题: System and method for operation verification of semiconductor integrated circuit
- 专利标题(中): 半导体集成电路运行验证的系统和方法
-
申请号: US11138499申请日: 2005-05-27
-
公开(公告)号: US07171640B2公开(公告)日: 2007-01-30
- 发明人: Yuka Terai , Kyoji Yamashita
- 申请人: Yuka Terai , Kyoji Yamashita
- 申请人地址: JP Osaka
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2004-201833 20040708
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
A system for operation verification of a semiconductor integrated circuit has a central processing unit, a design layout memory unit storing design layout information including the design layout configuration of the semiconductor integrated circuit, and a predicted final layout memory storing a predicted final layout configuration predicted by the central processing unit by adding an optical proximity effect to the design layout configuration. The system further has a netlister which describes a procedure for causing the central processing unit to produce a plurality of net lists in which different physical values are registered for a common element in the predicted final layout configuration, a netlist memory unit the plurality of net lists, and a circuit simulator which describes a procedure for causing the central processing unit to perform operation verification of the semiconductor integrated circuit by using an arbitrary one of the plurality of net lists.
公开/授权文献
信息查询