发明授权
- 专利标题: High dielectric constant device
- 专利标题(中): 高介电常数器件
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申请号: US10459360申请日: 2003-06-10
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公开(公告)号: US07183604B2公开(公告)日: 2007-02-27
- 发明人: Eduard Cartier , Jerry Chen , Chao Zhao
- 申请人: Eduard Cartier , Jerry Chen , Chao Zhao
- 申请人地址: BE Leuven
- 专利权人: Interuniversitair Microelektronica Centrum (IMEC vzw)
- 当前专利权人: Interuniversitair Microelektronica Centrum (IMEC vzw)
- 当前专利权人地址: BE Leuven
- 代理机构: McDonnell Boehnen Hulbert & Berghoff LLP
- 主分类号: H01L29/94
- IPC分类号: H01L29/94
摘要:
Dielectric material compositions comprising HfO2 and a second compound are disclosed. The compositions are characterized by at least a part of the compositions being in a cubic crystallographic phase. Further, semiconductor based devices comprising such dielectric material compound and method for forming such compounds are disclosed.
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