发明授权
- 专利标题： Diode detecting circuit
- 专利标题（中）： 二极管检测电路
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申请号： US10998729申请日： 2004-11-30
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公开(公告)号： US07183839B2公开(公告)日： 2007-02-27
- 发明人: Shinji Saito
- 申请人： Shinji Saito
- 申请人地址： JP Kawasaki
- 专利权人： Fujitsu Limited
- 当前专利权人： Fujitsu Limited
- 当前专利权人地址： JP Kawasaki
- 代理机构： Arent Fox PLLC
- 优先权： JP2004-206333 20040713
- 主分类号： H03D3/02
- IPC分类号： H03D3/02
摘要：
A diode detecting circuit which cancels temperature dependence of a detecting diode so as to obtain highly sensitive detection. The diode detecting circuit has a first diode detecting unit in which a first diode detects an input signal biased by a bias voltage, a second diode detecting unit in which a second diode receives the bias voltage, and an output unit which compares an output from the first diode detecting unit with an output from the second diode detecting unit.
公开/授权文献
- US20060012422A1 Diode detecting circuit 公开/授权日：2006-01-19
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