发明授权
- 专利标题： Work piece holding apparatus, work piece illumination apparatus and work piece inspection system
- 专利标题（中）： 工件夹持装置，工件照明装置和工件检查系统
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申请号： US10834346申请日： 2004-04-29
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公开(公告)号： US07192150B2公开(公告)日： 2007-03-20
- 发明人: Yoshihiko Miyakawa , Hidetoshi Suzuki , Hiroshi Wakabayashi , Hitoshi Nakayama , Akimasa Nakao
- 申请人： Yoshihiko Miyakawa , Hidetoshi Suzuki , Hiroshi Wakabayashi , Hitoshi Nakayama , Akimasa Nakao
- 申请人地址： JP Tokyo
- 专利权人： TDK Corporation
- 当前专利权人： TDK Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权： JP2003-150361 20030528
- 主分类号： F21V13/00
- IPC分类号： F21V13/00
摘要：
The present invention relates to an electronic part holding apparatus used for an FPC bonding apparatus or the like. An object of the present invention is to provide the structure including an illumination apparatus used for image detection that can illuminate a predetermined area stably and uniformly. To attain that object, in the holding apparatus having functions of holding and illuminating a work piece, the holding position and the illumination position are made different, and the deformation of the work piece is made possible at the illumination position.