发明授权
US07196775B2 Patterned mask holding device and method using two holding systems
有权
图案掩模保持装置和方法使用两个保持系统
- 专利标题: Patterned mask holding device and method using two holding systems
- 专利标题(中): 图案掩模保持装置和方法使用两个保持系统
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申请号: US10922862申请日: 2004-08-23
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公开(公告)号: US07196775B2公开(公告)日: 2007-03-27
- 发明人: Daniel N. Galburt
- 申请人: Daniel N. Galburt
- 申请人地址: NL Veldhoven
- 专利权人: ASML Holding N.V.
- 当前专利权人: ASML Holding N.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- 主分类号: G03B27/62
- IPC分类号: G03B27/62 ; G03B27/42
摘要:
A system and method that eliminate or substantially reduce slippage of a pattern generator with respect to a pattern generator holding device during a scanning portion of an exposure operation. In first and second examples, this is done by either (a) continuously or (b) when needed concurrently using first and second pattern generator holding systems to hold the pattern generator to the pattern generator holding device. In these examples, the first pattern generator holding systems utilizes an electrostatic system to attract the pattern generator to the pattern generator holding device and the second pattern generator holding system utilizes a vacuum system to attract the pattern generator to the pattern generator holding device.
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