Invention Grant
- Patent Title: Method for removing polymer as etching residue
- Patent Title (中): 去除聚合物作为蚀刻残留物的方法
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Application No.: US10904149Application Date: 2004-10-26
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Publication No.: US07199059B2Publication Date: 2007-04-03
- Inventor: Yi-Fang Cheng , Shan-Jen Yu , Cheng-Kweng Chen , Yu-Ming Huang
- Applicant: Yi-Fang Cheng , Shan-Jen Yu , Cheng-Kweng Chen , Yu-Ming Huang
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/461

Abstract:
A method for removing polymer as an etching residue is described. A substrate with polymer as an etching residue thereon is provided, and a hydrogen-containing plasma is used to treat the substrate. A wet clean step is then performed to remove the polymer from the substrate. The treatment using hydrogen-containing plasma can change the chemical property of the polymer, so that the polymer can be removed more easily in the subsequent wet clean step.
Public/Granted literature
- US20060089003A1 METHOD FOR REMOVING POLYMER AS ETCHING RESIDUE Public/Granted day:2006-04-27
Information query
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