发明授权
- 专利标题: Sensing scheme for low-voltage flash memory
- 专利标题(中): 低压闪存检测方案
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申请号: US10932489申请日: 2004-09-02
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公开(公告)号: US07200041B2公开(公告)日: 2007-04-03
- 发明人: Giulio G. Marotta , Tommaso Vali
- 申请人: Giulio G. Marotta , Tommaso Vali
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Leffert Jay & Polglaze, PA
- 优先权: ITRM2001A0001 20010103
- 主分类号: G11C11/34
- IPC分类号: G11C11/34
摘要:
Single-ended sensing devices for sensing a programmed state of a floating-gate memory cell are adapted for use in low-voltage memory devices. The sensing device has an input node selectively coupled to the memory cell. The sensing device includes a precharging path for applying a precharge potential to the input node of the sensing device for precharging bit lines prior to sensing the programmed state of the memory cell, and a reference current path for applying a reference current to the input node of the sensing device. The sensing device still further includes a sense inverter having an input coupled to the input node of the sensing device and an output for providing an output signal indicative of the programmed state of the memory cell. The reference current is applied to the input node of the sensing device during sensing of the programmed state of the memory cell.
公开/授权文献
- US20050041469A1 Sensing scheme for low-voltage flash memory 公开/授权日:2005-02-24
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