Invention Grant
- Patent Title: Patch measurement device
- Patent Title (中): 贴片测量装置
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Application No.: US10186711Application Date: 2002-07-02
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Publication No.: US07202973B2Publication Date: 2007-04-10
- Inventor: Takaharu Yamamoto , Tsuyoshi Okuda
- Applicant: Takaharu Yamamoto , Tsuyoshi Okuda
- Applicant Address: JP Kyoto
- Assignee: Dainippon Screen MFG. Co., Ltd.
- Current Assignee: Dainippon Screen MFG. Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: McDermott Will & Emery LLP
- Priority: JP2001-203848 20010704; JP2001-221618 20010723; JP2002-167609 20020607
- Main IPC: H04N1/46
- IPC: H04N1/46 ; G06K15/00

Abstract:
In a patch measurement device, a data storage section stores printed-image data including a control strip on a printed material. Based on the pixel values constituting printed-image data stored in the data storage section, a patch position detection section detects the position of a patch. A color density measurement section measures the color density of the patch whose position has been detected by the patch position detection section. A correlation coefficient ρm between a key pattern x and subject data y which is calculated by a reference mark detection section is represented as ρm=([x]*[y])−([x]−1*[y]), where [x]*[y] is a sum of multiplication products of corresponding elements of the two matrices. Matrix [x]−1 represents an inverted pattern of the key pattern x. Even if the subject data y is of an unrelated pattern resembling the key pattern x having different signal levels from those of the key pattern x, the resultant correlation coefficient ρm has a small value, thereby indicative of a low correlation. The resultant correlation coefficient ρm also becomes small if the subject data y is that of a solid patch, due to cancellation by a drastic subtraction.
Public/Granted literature
- US20030011798A1 Patch measurement device Public/Granted day:2003-01-16
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